首页> 外文期刊>Journal of Crystal Growth >Reply to 'Comments on the article 'Transport properties of Sn-doped InSb thin films and application to Hall element [J. Crys Growth 251(2003)560]' by M. Oszwaldowski [J. Crys Growth 260(2004)600]'
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Reply to 'Comments on the article 'Transport properties of Sn-doped InSb thin films and application to Hall element [J. Crys Growth 251(2003)560]' by M. Oszwaldowski [J. Crys Growth 260(2004)600]'

机译:答复M. Oszwaldowski [J.教授的文章“掺Sn的InSb薄膜的传输特性及其在霍尔元件中的应用[J. Crys Growth 251(2003)560]”的评论。 Crys Growth 260(2004)600]'

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摘要

We think that there are some fundamental mistakes and misunderstanding in the comments by M. Oszwaldowski. The comments are mainly based on experimental results of films deposited on insulating substrates (not GaAs) by vacuum deposition. The films contain Sn of the order of percent, and were annealed after deposition because non-annealed films showed low mobility. We believe that the comments describe completely different phenomena than the contents of our paper which is about InSb films grown epitaxially on GaAs substrates by MBE. We do not agree that the properties of InSb containing Sn of the order of several percent and those of InSb single crystal films doped to ppm order during growth by MBE are the same.
机译:我们认为Oszwaldowski先生的评论存在一些根本性的错误和误解。这些评论主要基于通过真空沉积在绝缘基板(不是GaAs)上沉积膜的实验结果。该膜包含百分之几的锡,并且在沉积之后进行退火,因为未退火的膜显示出低迁移率。我们相信,这些评论所描述的现象与我们的论文内容完全不同,后者是关于MBE在GaAs衬底上外延生长的InSb膜的。我们不同意在MBE生长过程中,含Sn的InSb的性能约为百分之几,与掺入ppm级的InSb单晶膜的性能相同。

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  • 来源
    《Journal of Crystal Growth》 |2004年第4期|p.603-605|共3页
  • 作者单位

    Asahikasei Corporation, Strategic Research and Development, Samejima 2-1, Fuji Shizuoka 4168501, Japan;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 晶体学;
  • 关键词

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