Schlieren technique to in situ monitor rapidly-growing KDP crystal surface

摘要

A technique based on the optical Schlieren method is developed to investigate in situ the growing crystal morphology under real rapid profiling growth ocnditions. The paper deals with the technique and results of experiments related to rapid profiled growth of a KDP crystal with the cross-section 8×8 cm~2 and the (1 0 1) or (1 0 0) face growing at a normal growth rate upto 1 mm/h. It is shown thatthe sturcture of growth centers on the growing surface essentially depends on the growth conditions, which provide additional possibilities of the crystal quality control.