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首页> 外文期刊>Journal of Computing and Information Science in Engineering >Tolerance-Maps to Model Composite Positional Tolerancing for Patterns of Features
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Tolerance-Maps to Model Composite Positional Tolerancing for Patterns of Features

机译:公差映射,用于为特征模式建模复合位置公差

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摘要

For the first time, Tolerance-Maps (T-Maps) are constructed to model composite positional tolerancing applied to patterns (arrays) of features. The T-Map for a feature is a range (codomain) of points obtained by mapping all the variational possibilities (domain) of a feature within its tolerance zone to a hypothetical Euclidean point space. T-Maps have already been developed for tolerances applied to single features, such as to a simple axis (line), a plane, and a cylinder, but not for the special methods available for tolerancing patterns of features. In this paper, the different pattern tolerancing methods listed in the standards produce distinctions in geometric shape, proportions, and/or dimensions of a T-Map. The T-Map geometry is different when tolerances are specified with composite position tolerancing rather than with two-single-segment control frames. Additional changes to geometry occur when material modifiers are also specified. Two levels of T-Maps are proposed for a pattern of features. One is at the assembly level to ensure the assembly of an engaging pattern of pins and holes, such as the array of pins on an integrated circuit, which are to be inserted into a base. The second is at the part level to model the variations between the two parts that contain the engaging patterns. The assembly-level T-Maps apply to any number of engaging pin/hole features arranged in any pattern: linear, circular, rectangular, or irregular. In this paper, the part-level T-Map is restricted to linear patterns. The different specifications are also compared with a statistical analysis of misalignment for an assembly with a pattern of pins and holes.
机译:首次构建了公差地图(T-Maps),以对应用于特征模式(阵列)的复合位置公差建模。特征的T映射是通过将特征在其公差范围内的所有变化可能性(域)映射到假设的欧几里得点空间而获得的点的范围(共域)。 T-Maps已针对将公差应用于单个特征(例如,简单轴(线),平面和圆柱体)而开发,但尚未针对可用于公差特征图案的特殊方法开发。在本文中,标准中列出的不同图案公差方法会在T形图的几何形状,比例和/或尺寸上产生区别。当使用复合位置公差而不是两个单段控制框架指定公差时,T-Map几何形状会有所不同。如果还指定了材质修改器,则会对几何图形进行其他更改。为特征模式提出了两个级别的T-Map。一种是在组装级别上,以确保将要插入基座的销和孔的接合图案的组装,例如集成电路上的销的阵列。第二个是在零件级别上建模包含接合模式的两个零件之间的变化。装配级T型贴图适用于以任何模式排列的任意数量的接合销/孔特征:线性,圆形,矩形或不规则形状。在本文中,零件级T-Map限于线性模式。还将不同的规格与带有销钉和孔图案的组件的未对准统计分析进行了比较。

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