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Static and dynamic characteristics of dual gate organic TFT based NAND and NOR circuits

机译:基于双栅极有机TFT的NAND和NOR电路的静态和动态特性

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摘要

This research paper analyzes the static and dynamic behavior of dual-gate organic thin film transistors (DG-OTFTs) based universal logic gates using the Atlas 2-D numerical device simulator. The electrical characteristics and performance parameters of pentacene based DG-OTFT is evaluated and verified with respect to the reported experimental results. The NAND and NOR logic gate circuits are realized using p-type designs in diode-load logic (DLL) and zero- V_(gs) -load logic (ZVLL). The results show that the logic functions in ZVLL configuration outperforms the DLL ones mainly in terms of noise margin, gain and voltage swing; however, there is a trade-off in terms of speed. The ZVLL NAND gate demonstrates an increment of 16 and 32% in voltage swing and noise margin, respectively in comparison to the DLL one. Besides this, the gain also increases by 1.5 times in ZVLL mode. On the contrary, the DLL configuration demonstrates a significant reduction of 64 % in the propagation delay in comparison to the ZVLL. Similarly, NOR gate shows an increment of 24 and 30 % in voltage swing and noise margin, respectively under ZVLL configuration. However, the propagation delay for DLL NOR configuration is one-fourth of that of its ZVLL counterpart.
机译:本研究论文使用Atlas二维数字设备仿真器分析了基于双栅极有机薄膜晶体管(DG-OTFT)的通用逻辑门的静态和动态行为。并五苯基于DG-OTFT的电特性和性能参数已针对所报告的实验结果进行了评估和验证。使用二极管负载逻辑(DLL)和零V_(gs)负载逻辑(ZVLL)中的p型设计实现NAND和NOR逻辑门电路。结果表明,ZVLL配置的逻辑功能主要在噪声容限,增益和电压摆幅方面优于DLL。但是,在速度方面需要权衡。与DLL 1相比,ZVLL NAND门的电压摆幅和噪声容限分别增加了16%和32%。除此之外,增益在ZVLL模式下也增加了1.5倍。相反,与ZVLL相比,DLL配置的传输延迟显着降低了64%。同样,在ZVLL配置下,NOR门显示的电压摆幅和噪声容限分别增加了24%和30%。但是,DLL NOR配置的传播延迟是ZVLL对应传播延迟的四分之一。

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