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Video-rate fluorescence lifetime imaging camera witl CMOS single-photon avalanche diode arrays and high-speed imaging algorithm

机译:CMOS单光子雪崩二极管阵列的视频速率荧光寿命成像相机和高速成像算法

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摘要

A high-speed and hardware-only algorithm using a center of mass method has been proposed for single detector fluorescence lifetime sensing applications. This algorithm is now implemented on a field programmable gate array to provide fast lifetime estimates from a 32 × 32 low dark count 0.13 μm complementary metal oxide-semiconductor single-photon avalanche diode (SPAD) plus time-to-digital converter array. A simple look-up table is included to enhance the lifetime resolvability range and photon economics, making it comparable to the commonly used least-square method and maximum-likelihood estimation based software. To demonstrate its performance, a widefield microscope was adapted to accommodate the SPAD array and image different test samples. Fluorescence lifetime imaging microscopy on fluorescent beads in Rhodamine 6C at a frame rate of 50 fps is also shown.
机译:对于单探测器荧光寿命传感应用,已经提出了一种使用质心方法的高速且仅硬件的算法。该算法现在在现场可编程门阵列上实施,以提供32×32低暗计数0.13μm互补金属氧化物半导体单光子雪崩二极管(SPAD)加上时间数字转换器阵列的快速寿命估算。包含一个简单的查找表,以延长寿命可分辨范围和光子经济性,使其可与常用的最小二乘法和基于最大似然估计的软件相提并论。为了证明其性能,对宽视场显微镜进行了改装,以容纳SPAD阵列并成像不同的测试样品。还显示了若丹明6C中荧光珠在50 fps帧频下的荧光寿命成像显微镜。

著录项

  • 来源
    《Journal of biomedical optics》 |2011年第9期|p.096012.1-096012.12|共12页
  • 作者单位

    University of Sussex, Biomedical Engineering Croup, Department of Engineering and Design, School of Engineering and Informatics, Brighton BN1 9QT, United Kingdom,University of Edinburgh, Institute for Integrated Micro and Nano Systems, Joint Research Institute for Signal & Image Processing/Integrated Systems/Energy/Civil and Environmental Engineering, School of Engineering, Faraday Building,King's Buildings, Edinburgh EH9 3JL, Scotland, United Kingdom;

    University of Edinburgh, SUPA, COSMIC, School of Physics and Astronomy, Joseph Black Building, King's Buildings,Edinburgh EH9 3JZ, Scotland, United Kingdom;

    University of Edinburgh, Institute for Integrated Micro and Nano Systems, Joint Research Institute for Signal & Image Processing/Integrated Systems/Energy/Civil and Environmental Engineering, School of Engineering, Faraday Building,King's Buildings, Edinburgh EH9 3JL, Scotland, United Kingdom;

    University of Edinburgh, Institute for Integrated Micro and Nano Systems, Joint Research Institute for Signal & Image Processing/Integrated Systems/Energy/Civil and Environmental Engineering, School of Engineering, Faraday Building,King's Buildings, Edinburgh EH9 3JL, Scotland, United Kingdom;

    University of Edinburgh, Institute for Integrated Micro and Nano Systems, Joint Research Institute for Signal & Image Processing/Integrated Systems/Energy/Civil and Environmental Engineering, School of Engineering, Faraday Building,King's Buildings, Edinburgh EH9 3JL, Scotland, United Kingdom,STMicroelectronics, 33 Pinkhill, Edinburgh EH12 7BF, Scotland, United Kingdom;

    Fondazione Bruno Kessler, Smart Optical Sensors and Interfaces, 38122 Trento, Italy;

    Delft University of Technology, Faculty Electrical Engineering, Mathematics and Computer Science, Mekelweg 4,2628CD Delft, The Netherlands;

    University of Edinburgh, Institute for Integrated Micro and Nano Systems, Joint Research Institute for Signal & Image Processing/Integrated Systems/Energy/Civil and Environmental Engineering, School of Engineering, Faraday Building,King's Buildings, Edinburgh EH9 3JL, Scotland, United Kingdom;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《化学文摘》(CA);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    fluorescence lifetime imaging microscopy; time-resolved imaging; photon counting; complementary metal-oxide semiconductor; single-photon avalanche diode; center-of-mass;

    机译:荧光寿命成像显微镜;时间分辨成像光子计数互补金属氧化物半导体;单光子雪崩二极管;质量中心;

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