Bayesian approach to the inverse problem in a light scattering application

摘要

In this article, static light scattering (SLS) measurements are processed to estimate the particle size distribution of particle systems incorporating prior information obtained from an alternative experimental technique: scanning electron microscopy (SEM). For this purpose we propose two Bayesian schemes (one parametric and another non-parametric) to solve the stated light scattering problem and take advantage of the obtained results to summarize some features of the Bayesian approach within the context of inverse problems. The features presented in this article include the improvement of the results when some useful prior information from an alternative experiment is considered instead of a non-informative prior as it occurs in a deterministic maximum likelihood estimation. This improvement will be shown in terms of accuracy and precision in the corresponding results and also in terms of minimizing the effect of multiple minima by including significant information in the optimization. Both Bayesian schemes are implemented using Markov Chain Monte Carlo methods. They have been developed on the basis of the Metropolis-Hastings (MH) algorithm using Matlab((R)) and are tested with the analysis of simulated and experimental examples of concentrated and semi-concentrated particles. In the simulated examples, SLS measurements were generated using a rigorous model, while the inversion stage was solved using an approximate model in both schemes and also using the rigorous model in the parametric scheme. Priors from SEM micrographs were also simulated and experimented, where the simulated ones were obtained using a Monte Carlo routine. In addition to the presentation of these features of the Bayesian approach, some other topics will be discussed, such as regularization and some implementation issues of the proposed schemes, among which we remark the selection of the parameters used in the MH algorithm.