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Interrelation of Electronic Properties and Defect Equilibria in PbTe

机译:PbTe中电子性质和缺陷平衡的相互关系

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摘要

The resistivity, Hall coefficient, and Seebeck coefficient of single crystals of PbTe were investigated in the range from 77° to 900°K using a capsuling arrangement which prevented tellurium loss from the specimens at elevated temperatures. The low temperature properties obtained agree with the data reported in the literature. The thermal energy gap obtained from the high temperature measurements cannot, however, be brought into agreement with the energy gap determined from room temperature absorption measurements by considering solely the excitation of electron‐hole pairs across the energy gap at elevated temperatures. Rather, it is necessary to include the carriers generated by defect formation at elevated temperatures. Both Schottky‐Wagner and Frenkel defects are present, the activation energies for formation of the two types of defects being related by the equation EF=½ES+0.55 ev≃0.7 ev.
机译:使用倒装装置防止了高温下样品中碲的损失,在77°至900°K范围内研究了PbTe单晶的电阻率,霍尔系数和塞贝克系数。获得的低温特性与文献报道的数据一致。但是,不能通过仅考虑在升高的温度下穿过整个能隙的电子-空穴对的激发,来使通过高温测量获得的热能隙与根据室温吸收测量所确定的能隙一致。相反,必须包括在高温下由缺陷形成产生的载体。肖特基-瓦格纳缺陷和弗伦克尔缺陷均存在,形成这两种类型缺陷的活化能与方程EF = 1 / 2ES +0.55ev≃0.7ev有关。

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    《Journal of Applied Physics》 |1961年第11期|共9页
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  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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