Electrothermomigration and filament growth in p‐InP with Au contacts

摘要

Metal migration induced by electric field and temperature gradients has been studied in Zn‐doped InP with Au contacts. A new failure mode has been observed which involves a temperature‐induced decomposition of InP, followed by the formation of a liquid filament nucleating at the negative Au contact. The filament subsequently grows to short out the two contacts. Two forms of filaments are observed; type I is straight and narrow and contains no Au, whereas type II is broader, propagates more slowly, and contains Au. An explanation is presented to rationalize the results.