Calibration of the photoluminescence technique for measuring concentrations of shallow dopants in Ge

摘要

A systematic study of the photoluminescence (PL) from excitons bound to shallow donors or acceptors in Al-, As-, B-, Ga-, In-, P-, and Sb-doped Ge is presented. The results of the PL measurements are correlated with those from photothermal ionization spectroscopy and Hall effect measurements. The dissociation energy of the excitons is shown to satisfy Haynes rule. A calibration is presented, which allows a determination of the donor and acceptor concentrations from their respective bound exciton intensities related to the free exciton intensity.