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Applications of chip-scale semiconductor metamaterials based on plasmon-induced transparency in modulation and sensing

机译:芯片尺度半导体超材料的应用基于等离子体诱导的调制与传感透明度

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摘要

We propose and simulate the tunable plasmon-induced transparency (PIT) phenomenon of semiconductor-based H-shaped chip-scale metamaterials. Numerical analysis shows that the PIT phenomenon is caused by the destructive interference between two bright modes, and the equivalent Lorentz model also proves its physical mechanism appropriately. In addition, in practical applications, changing the polarization angle can adjust the group delay, and the maximum group delay is 41.92 ps; changing the temperature can adjust the transmission peak frequency of the PIT effect, which can be applied to temperature sensing and thermo-optic switches. The amplitude modulation depth can reach 97.8%. The application of this chip-scale semiconductor metamaterial in modulators and sensors opens up new ways.
机译:我们提出并模拟了基于半导体的H形芯片级超材料的可调谐等离子体诱导的透明度(坑)现象。 数值分析表明,凹坑现象是由两个明亮模式之间的破坏性干扰引起的,而等效的洛伦兹模型也适当证明其物理机制。 另外,在实际应用中,改变偏振角可以调节组延迟,最大组延迟为41.92 ps; 改变温度可以调节凹坑效果的传输峰值频率,可以应用于温度传感和热视光开关。 幅度调制深度可达到97.8%。 该芯片级半导体超材料在调制器和传感器中的应用打开了新的方式。

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  • 来源
    《Journal of Applied Physics》 |2021年第13期|133105.1-133105.10|共10页
  • 作者单位

    Key Laboratory of Instrumentation Science and Dynamic Measurement Ministry of Education North University of China Tai Yuan 030051 China Science and Technology on Electronic Test and Measurement Laboratory North University of China Tai Yuan 030051 China;

    Key Laboratory of Instrumentation Science and Dynamic Measurement Ministry of Education North University of China Tai Yuan 030051 China Science and Technology on Electronic Test and Measurement Laboratory North University of China Tai Yuan 030051 China;

    Key Laboratory of Instrumentation Science and Dynamic Measurement Ministry of Education North University of China Tai Yuan 030051 China Science and Technology on Electronic Test and Measurement Laboratory North University of China Tai Yuan 030051 China;

    Key Laboratory of Instrumentation Science and Dynamic Measurement Ministry of Education North University of China Tai Yuan 030051 China Science and Technology on Electronic Test and Measurement Laboratory North University of China Tai Yuan 030051 China;

    Key Laboratory of Instrumentation Science and Dynamic Measurement Ministry of Education North University of China Tai Yuan 030051 China Science and Technology on Electronic Test and Measurement Laboratory North University of China Tai Yuan 030051 China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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