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首页> 外文期刊>Journal of Applied Physics >Two-step excitation induced photovoltaic properties in an InAs quantum dot-in-well intermediate-band solar cell
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Two-step excitation induced photovoltaic properties in an InAs quantum dot-in-well intermediate-band solar cell

机译:在INAS量子点井中中间带太阳能电池中的两步激发诱导光伏性能

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摘要

Owing to the additional usage of sub-bandgap photons, the intermediate-band solar cell has been regarded as a promising device design to exceed the conversion limits of conventional photovoltaic devices. An output-voltage preservation is theoretically possible in this kind of device in the case of independent quasi-Fermi levels. This phenomenon manifests experimentally in a voltage recovery induced by supplementary two-step photon absorption processes. Here, we study the excitation-power and temperature dependences of the voltage performance in an intermediate-band solar cell containing InAs quantum dots in Al_(0.3)Ga_(0.7)As/GaAs quantum wells. The two-color photoexcitation method is used to separately control the interband and quantum dot-conduction band transitions. The output voltage is sensitive to the balance between the two excitation densities and the cell temperature. It is found that a strongly asymmetric irradiation can even lead to a voltage decrease. The temperature-dependent data suggest a faster electron-hole annihilation at lower temperatures. We introduce a new characteristic index to qualitatively evaluate the carrier loss in the intermediate band.
机译:由于子带隙光子的额外使用,中间带太阳能电池被认为是有前途的装置设计,以超过传统光伏器件的转换限制。在独立的准细度水平的情况下,在这种装置中理论上可能是可能的输出电压保存。这种现象在通过补充的两步光子吸收过程诱导的电压回收中实验表现出。在这里,我们研究了在AL_(0.3)GA_(0.7)中的INAS量子点的中间带太阳能电池中的电压性能的激励功率和温度依赖性。双色相磷透明度方法用于单独控制间间和量子点传导频带转换。输出电压对两个激发密度和细胞温度之间​​的平衡敏感。发现强烈不对称的照射甚至可以导致电压降低。温度依赖的数据表明在较低温度下更快的电子空穴湮灭。我们介绍了一个新的特征指数来定性地评估中间带中的载波损失。

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  • 来源
    《Journal of Applied Physics》 |2021年第7期|074503.1-074503.12|共12页
  • 作者单位

    Department of Electrical and Electronic Engineering Graduate School of Engineering Kobe University 1-1 Rokkodai Nada Ward Kobe Hyogo 657-8501 Japan;

    Department of Electrical and Electronic Engineering Graduate School of Engineering Kobe University 1-1 Rokkodai Nada Ward Kobe Hyogo 657-8501 Japan;

    Department of Electrical and Electronic Engineering Graduate School of Engineering Kobe University 1-1 Rokkodai Nada Ward Kobe Hyogo 657-8501 Japan;

    Research Center for Advanced Science and Technology (RCAST) The University of Tokyo 4-6-1 Komaba Meguro-ku Tokyo 153-8904 Japan;

    Research Center for Advanced Science and Technology (RCAST) The University of Tokyo 4-6-1 Komaba Meguro-ku Tokyo 153-8904 Japan;

    Department of Electrical and Electronic Engineering Graduate School of Engineering Kobe University 1-1 Rokkodai Nada Ward Kobe Hyogo 657-8501 Japan;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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