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首页> 外文期刊>Journal of Applied Physics >High electron density β-(Al_(0.17)Ga_(0.83))_2O_3/Ga_2O_3 modulation doping using an ultra-thin (1 nm) spacer layer
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High electron density β-(Al_(0.17)Ga_(0.83))_2O_3/Ga_2O_3 modulation doping using an ultra-thin (1 nm) spacer layer

机译:高电子密度β-(AL_(0.17)GA_(0.83))_ 2O_3 / GA_2O_3使用超薄(1nm)间隔层的调制掺杂

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摘要

This report discusses the design and demonstration of β-(Al_(0.17)Ga_(0.83))_2O_3/Ga_2O_3 modulation doped heterostructures to achieve high sheet charge density. The use of a thin spacer layer between the Si delta-doping and the heterojunction interface was investigated in a β-(AlGa)_2O_3/Ga_2O_3 modulation doped structure. It is shown that this strategy enables a higher two-dimensional electron gas (2DEG) sheet charge density up to 4.7 × 10~(12)cm~(-2) with an effective mobility of 150 cm~2/V s. The presence of a degenerate 2DEG channel was confirmed by the measurement of a low temperature effective mobility of 375 cm~2/V s and the lack of carrier freeze out from low temperature capacitance voltage measurements. The electron density of 4.7 × 10~(12)cm~(-2) is the highest reported 2DEG density obtained without parallel conducting channels in a β-(Al_xGa_((1-x)))_2O_3/Ga_2O_3 heterostructure system.
机译:本报告讨论了β-(AL_(0.17)GA_(0.83))_ 2O_3 / GA_2O_3调制掺杂异质结构以实现高纸张充电密度的设计和演示。在β-(藻类)_2O_3 / GA_2O_3调制掺杂结构中研究了在Siδ掺杂和异质结界面之间使用薄的间隔层。结果表明,该策略使得高达4.7×10〜(12)cm〜(-2)的高达4.7×10〜(12)Cm〜(-2)的高达4.7×10〜(2deg)的较高的二维电子气体(2deg)。通过测量375cm〜2 / V S的低温有效迁移率并且缺少载波从低温电容电压测量冻结,确认退化2deg通道的存在。 4.7×10〜(12)cm〜(-2)的电子密度是报告的2DEG密度,在β-(AL_XGA _((1-x))中的不平行导电通道中获得的2DEG密度)_ 2O_3 / GA_2O_3异质结构系统。

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  • 来源
    《Journal of Applied Physics 》 |2020年第21期| 215706.1-215706.7| 共7页
  • 作者单位

    Department of Electrical and Computer Engineering The Ohio State University Columbus Ohio 43210 USA;

    Department of Electrical and Computer Engineering The Ohio State University Columbus Ohio 43210 USA;

    Department of Electrical and Computer Engineering The Ohio State University Columbus Ohio 43210 USA;

    Department of Materials Science and Engineering The Ohio State University Columbus Ohio 43210 USA;

    Department of Electrical and Computer Engineering The Ohio State University Columbus Ohio 43210 USA;

    Department of Electrical and Computer Engineering The Ohio State University Columbus Ohio 43210 USA;

    Department of Electrical and Computer Engineering The Ohio State University Columbus Ohio 43210 USA Department of Materials Science and Engineering The Ohio State University Columbus Ohio 43210 USA;

    Department of Electrical and Computer Engineering The Ohio State University Columbus Ohio 43210 USA Department of Materials Science and Engineering The Ohio State University Columbus Ohio 43210 USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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