Optical reflectivity as a simple diagnostic method for testing structural quality of icosahedral quasicrystals

摘要

The optical reflectivity of Al-based and Ti-based quasicrystalline and approximant samples were investigated versus the quality of their structural morphology using optical reflectometry, x-ray diffraction, and transmission electron microscopy. The different structural morphologies were obtained using three different preparation processes: sintering, pulsed laser deposition, and reactive cathodic magnetron sputtering. The work demonstrates that the canonical behavior of icosahedral state in specular reflectivity is extremely sensitive to different and very fine aspects of the microstructure: sizes of grains smaller than 50 nm, slight local diffuse disorder, and shifts away from the icosahedral crystallographic structure (approximants). The work explains why the optical properties of the same kind of quasicrystals found in literature sometimes reveal a different behavior from one author to another. The study then confirms the work of some authors and definitely shows that the canonical behavior of icosahedral state in specular reflectivity over the 30 000-50 000 cm~(-1) domain is characterized by a decreasing function made of steps. It also shows that this behavior can be interpreted thanks to the cluster hierarchy of the model of Janot [Phys. Rev. B 53, 181 (1996)].