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首页> 外文期刊>Journal of Applied Physics >Time Dependence Of The Electronic Structure Of An Electron-beam-irradiated C_(60) Film
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Time Dependence Of The Electronic Structure Of An Electron-beam-irradiated C_(60) Film

机译:电子束辐照C_(60)薄膜电子结构的时间依赖性

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Time dependence of the electronic structure of an electron-beam (EB) irradiated C_(60) film (20-30 nm thick) has been examined using in situ high-resolution ultraviolet photoelectron spectroscopy. It is found that the electronic states of the C_(60) film have been changed continuously from an insulator (pristine C_(60) films) to a semiconductor and finally to a metal as EB-irradiation time increased. This can be explained by the increase in polymerization degree of a C_(60) polymer with a given cross-linked structure derived from the general Stone-Wales rearrangement from [Beu et al.,Phys. Rev. B 72, 155416 (2005)]. In addition, this finding suggests that the electronic properties of the C_(60) film can be controlled only in the EB-irradiated region by varying the irradiation time, which is interesting when applied to electronic devices.
机译:已经使用原位高分辨率紫外光电子能谱检查了电子束(EB)辐照的C_(60)膜(厚度为20-30 nm)的电子结构的时间依赖性。可以发现,随着EB照射时间的增加,C_(60)膜的电子状态已从绝缘体(原始C_(60)膜)连续变为半导体,最后变为金属。这可以用具有给定交联结构的C_(60)聚合物的聚合度增加来解释,该C_(60)聚合物源自[Beu et al。,Phys.Biol。 B 72,155416(2005)。另外,该发现表明,通过改变照射时间,仅可以在EB照射区域中控制C_(60)膜的电子性质,这在应用于电子设备时是令人感兴趣的。

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