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Properties of inductively coupled rf Ar/H_2 plasmas: Experiment and global model

机译:电感耦合rf Ar / H_2等离子体的性质:实验和整体模型

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Experiments with a Langmuir probe and optical emission spectroscopy combined with actinometry are carried out in inductively coupled rf (13.56 MHz) Ar/H_2 discharges at total pressures of 20 m, 40 m, and 60 mTorr in hydrogen fractions ranging from 0% to 50%. The measured electron energy probability functions (EEPFs), which deviate from the Maxwellian distributions owing to the depletion of high-energy electrons, can be approximated using two temperatures. The electron temperatures, which can be deduced from the slopes of low-energy and high-energy parts of the EEPFs, relatively abruptly increase with increasing the hydrogen fraction in the hydrogen fractions below 10%, whereas the measured electron density markedly decreases with increasing the hydrogen fraction in the hydrogen fractions below 20%. The effective ion mass, which can be estimated from the ion current collected into the probe, markedly decreases with increasing the hydrogen fraction. The density of hydrogen atoms estimated by actinometry markedly increases as molecular hydrogen is added to Ar discharges, and then gradually increases with increasing the hydrogen fraction at the hydrogen fractions higher than 10%-20%. A global model is used to study the effect of Ar dilution to hydrogen discharges on the plasma parameters assuming the Maxwellian electron energy distribution. The model results are compared with the experimental results, obtaining reasonably good agreement.
机译:用Langmuir探针和光发射光谱结合光化法进行的实验是在总压力20 m,40 m和60 mTorr的感应耦合rf(13.56 MHz)Ar / H_2放电中进行的,氢分数为0%至50% 。可以使用两个温度来近似测得的电子能量概率函数(EEPF),该函数由于高能电子的耗尽而偏离了麦克斯韦分布。可以从EEPF的低能部分和高能部分的斜率推导出的电子温度随着氢部分中氢部分的增加而低于10%时相对突然升高,而测得的电子密度则随着氢部分的增加而显着降低。氢馏分中的氢馏分低于20%。有效离子质量(可根据收集到探针中的离子电流估算)随着氢含量的增加而显着降低。当将分子氢添加到Ar放电中时,通过光度法估算的氢原子密度显着增加,然后在氢分数高于10%-20%时,随着氢分数的增加而逐渐增加。假设麦克斯韦电子能量分布,使用全局模型研究氩气稀释对氢放电的影响对等离子体参数的影响。将模型结果与实验结果进行比较,取得了较好的一致性。

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  • 来源
    《Journal of Applied Physics 》 |2010年第8期| 083308.1-083308.9| 共9页
  • 作者

    Takashi Kimura; Hiroki Kasugai;

  • 作者单位

    Graduate School of Engineering, Nagoya Institute of Technology, Nagoya 466-8555, Japan;

    Graduate School of Engineering, Nagoya Institute of Technology, Nagoya 466-8555, Japan;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
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