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Validation of a correction procedure for removing the optical effects from transmission spectra of thin films on substrates

机译:验证从基板上薄膜的透射光谱中消除光学效应的校正程序的有效性

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摘要

Transmission spectra of thin films on double side polished substrates feature a quasi sinusoidal baseline superimposed onto the true absorption spectra of the thin film. The quasi sinusoidal baseline is due to strong interference from multiple reflections within the film and can directly affect the relative degree of the measured absorption in the film. In a previous article [S. W. King and M. Milosevic, J. Appl. Phys. 111, 073109 (2012)], we described a method for the removal of these optical effects from infrared transmission spectra. This method renormalizes the spectrum and removes modulations imprinted onto the absorption by interference fringes. Here, we use simulated spectra for a model material to explicitly validate that the proposed correction procedure accurately extracts the pure absorption coefficient of the thin film and is not an ad hoc baseline correction procedure.
机译:双面抛光基板上薄膜的透射光谱的特征是准正弦基线叠加在薄膜的真实吸收光谱上。准正弦基线是由于薄膜内多次反射的强烈干扰,会直接影响薄膜中测得的吸收率的相对程度。在上一篇文章[S. W. King和M. Milosevic,J。Appl。物理111,073109(2012)],我们描述了一种从红外透射光谱中去除这些光学效应的方法。此方法可将频谱重新归一化,并消除因干涉条纹而印在吸收线上的调制。在这里,我们使用模拟光谱作为模型材料来明确验证所提出的校正程序可以准确地提取薄膜的纯吸收系数,而不是临时的基线校正程序。

著录项

  • 来源
    《Journal of Applied Physics》 |2012年第9期|093514.1-093514.7|共7页
  • 作者

    Milan Milosevic; Sean W. King;

  • 作者单位

    MeV Technologies, Westport, Connecticut 06880, USA;

    Logic Technology Development, Intel Corporation, Hillsboro, Oregon 97124, USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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