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Analysis of metal elements by solution cathode glow discharge-atomic emission spectrometry with a modified pulsation damper

机译:改进的脉冲阻尼器通过溶液阴极辉光放电原子发射光谱法分析金属元素

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摘要

Solution-cathode glow discharge-atomic emission spectrometry (SCGD-AES) with a portable spectrometer was used to detect metal elements in solution. A modified pulsation damper was designed and optimized to improve discharge plasma stability. The effects of pulsation damper parameters as well as the discharge current and solution flow rate were investigated. The plasma stability of Na, K and Li elements under optimized parameters with the modified pulsation damper was discussed and they showed good stability over a long time. The standard deviation (SD) of background intensity was low, and the detection limits for Zn, Mg, Ag, Pb, Sr, Na, Li, K, Rb and Cs were 72, 2.1, 1.2, 35, 86, 0.04, 0.16, 0.14, 0.38 and 1.1 μg L~(-1), respectively. Ag, Zn and Pb elements in a certified reference material were quantitatively analyzed, and the measurement results obtained by SCGD-AES agreed well with the reference values. Specifically, the precision (relative standard deviation of 10 measured values) of detection was lower than 1.85%. The results show that the SCGD-AES system with the modified pulsation damper can accurately and stably detect the content of metal elements in water.
机译:带有便携式光谱仪的溶液阴极辉光放电原子发射光谱法(SCGD-AES)用于检测溶液中的金属元素。设计并优化了改进的脉动阻尼器,以提高放电等离子体的稳定性。研究了脉动阻尼器参数以及放电电流和溶液流速的影响。讨论了使用改进型脉动阻尼器优化参数下的Na,K和Li元素的等离子体稳定性,并在长时间内显示出良好的稳定性。背景强度的标准偏差(SD)低,并且Zn,Mg,Ag,Pb,Sr,Na,Li,K,Rb和Cs的检出限分别为72、2.1、1.2、35、86、0.04、0.16分别为0.14、0.38和1.1μgL〜(-1)。对认证参考材料中的Ag,Zn和Pb元素进行了定量分析,通过SCGD-AES获得的测量结果与参考值非常吻合。具体地说,检测的精度(10个测量值的相对标准偏差)低于1.85%。结果表明,采用改进型脉动阻尼器的SCGD-AES系统可以准确,稳定地检测水中的金属元素含量。

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  • 来源
    《Journal of Analytical Atomic Spectrometry》 |2017年第10期|1925-1931|共7页
  • 作者单位

    College of Optoelectronic Engineering, Chongqing University of Posts and Telecommunications, Chongqing Municipal Level Key Laboratory of Photoelectronic Information Sensing and Transmitting Technology, Chongqing 400065, P. R. China;

    College of Optoelectronic Engineering, Chongqing University of Posts and Telecommunications, Chongqing Municipal Level Key Laboratory of Photoelectronic Information Sensing and Transmitting Technology, Chongqing 400065, P. R. China;

    College of Optoelectronic Engineering, Chongqing University of Posts and Telecommunications, Chongqing Municipal Level Key Laboratory of Photoelectronic Information Sensing and Transmitting Technology, Chongqing 400065, P. R. China;

    College of Optoelectronic Engineering, Chongqing University of Posts and Telecommunications, Chongqing Municipal Level Key Laboratory of Photoelectronic Information Sensing and Transmitting Technology, Chongqing 400065, P. R. China;

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