Multi-pulse modulation method in photothermal atomic force microscopy for variable frequency modulation of incident light

摘要

Photothermal atomic force microscopy (PT-AFM) enables us to examine non-radiative recombination property with high spatial resolution. In order to realize variable frequency modulation of incident light in PT-AFM, we have proposed a multi-pulse modulation method, where the duration for light illumination is divided into multiple light pulses and their period is varied. We have assessed the validity of the proposed method through acquisition of photothermal signal images on microcrystalline materials under various modulation frequencies.