首页> 外文期刊>Japanese Journal of Applied Physics. Part 2, Letters >All-Optical Switching and Memorizing Devices Using Resonant Photon Tunneling Effect in Multi-Layered GaAs/AlGaAs Structures
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All-Optical Switching and Memorizing Devices Using Resonant Photon Tunneling Effect in Multi-Layered GaAs/AlGaAs Structures

机译:多层GaAs / AlGaAs结构中利用共振光子隧穿效应的全光开关记忆装置

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摘要

We propose a new structure for all-optical switch (AOS) and all-optical memory (AOM) devices that use the resonant photon tunneling effect in multi-layered GaAs/AlGaAs structures. Numerical calculations revealed a sharp peak in tunneling probability at a resonant incidence angle in double-barrier AOS structures. The resonance angle can be controlled by changing the refractive index of an active layer. During simulation, we demonstrated that the AOS with the new structure acts as an all-optical NOT gate. We also found that optical bi-stability occurs in the dependence of reflectivity on control light intensity. This bi-stability is caused by the penetration of intense input light to the active layer based on the resonant photon tunneling effect, and it is clear that an AOM can be achieved through this bi-stability effect. These results indicate that the resonant photon tunneling effect in multi-layered semiconductor structures can effectively be used to attain efficient all-optical devices.
机译:我们为使用多层GaAs / AlGaAs结构中的共振光子隧穿效应的全光开关(AOS)和全光存储器(AOM)器件提出了一种新结构。数值计算表明,在双势垒AOS结构中,在共振入射角处的隧穿概率出现一个尖峰。谐振角可以通过改变有源层的折射率来控制。在仿真过程中,我们证明了具有新结构的AOS充当全光学的NOT门。我们还发现,光学双稳定性取决于反射率与控制光强度的关系。这种双稳定性是由强输入光基于共振光子隧穿效应穿透到有源层引起的,很明显,通过这种双稳定性效应可以实现AOM。这些结果表明,多层半导体结构中的共振光子隧穿效应可以有效地用于获得有效的全光学器件。

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