High-Speed Phase-Modulation Atomic Force Microscopy in Constant-Amplitude Mode Capable of Simultaneous Measurement of Topography and Energy Dissipation

摘要

We have developed high-speed phase-modulation atomic force microscopy (PM-AFM) in a constant-amplitude (CA) mode. Using this imaging mode, we have theoretically demonstrated that energy dissipation due to tip-sample interaction can be obtained from the excitation amplitude of a cantilever. Moreover, we have found that the photothermal excitation method is better than the acoustic excitation method for cantilever oscillation in liquids. For the first time, we have demonstrated that a homebuilt high-speed PM-AFM in the CA mode has the capability to simultaneously measure the topography and energy dissipation with a material-specific contrast for a PS/PIB polymer-blend film.