...
首页> 外文期刊>Japanese journal of applied physics >Sequential Two-Dimensional Partial Response Maximum Likelihood Detection Scheme with Constant-Weight Constraint Code for Holographic Data Storage Systems
【24h】

Sequential Two-Dimensional Partial Response Maximum Likelihood Detection Scheme with Constant-Weight Constraint Code for Holographic Data Storage Systems

机译:具有恒定重量约束码的全息数据存储系统的顺序二维部分响应最大似然检测方案

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

A sequential two-dimensional (20) partial response maximum likelihood (PRML) detection scheme for holographic data storage (HDS) systems is proposed. We use two complexity reduction schemes, a reduced-state trellis and a constant-weight (CW) constraint. In the reduced-state trellis, the limited candidate bits surrounding the target bit are considered for the 2D PRML detector. In the CW constraint, the trellis transitions that violate the CW condition that each code-word block has only one white bit are eliminated. However, the 2D PRML detector using the complexity reduction schemes, which operates on 47 states and 169 branches, has performance degradation. To overcome performance degradation, a sequential detection algorithm uses the estimated a priori probability. By the sequential procedure, we mitigate 2D intersymbol interference with an enhanced reliability of the branch metric. Simulation results show that the proposed 2D PRML detection scheme yields about 3dB gains over the one-dimensional PRML detection scheme.
机译:提出了一种用于全息数据存储(HDS)系统的顺序二维(20)部分响应最大似然(PRML)检测方案。我们使用两种复杂度降低方案,即简化状态格网和恒定权重(CW)约束。在减少状态的格架中,目标位周围的有限候选位被认为是2D PRML检测器。在CW约束中,消除了违反CW条件(每个代码字块只有一个白位)的网格过渡。但是,使用复杂度降低方案的2D PRML检测器在47个状态和169个分支上运行,性能会下降。为了克服性能下降,顺序检测算法使用估计的先验概率。通过顺序过程,我们以增强的分支度量可靠性来减轻2D符号间干扰。仿真结果表明,所提出的二维PRML检测方案比一维PRML检测方案可产生约3dB的增益。

著录项

  • 来源
    《Japanese journal of applied physics》 |2012年第8issue3期|p.08JB08.1-08JB08.3|共3页
  • 作者

    Gyuyeol Kong; Sooyong Choi;

  • 作者单位

    School of Electrical and Electronic Engineering, Yonsei University, Seoul 120-749, Korea;

    School of Electrical and Electronic Engineering, Yonsei University, Seoul 120-749, Korea;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号