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首页> 外文期刊>Japanese journal of applied physics >Threshold-free evaluation of near-surface diffusion and adsorption-dominated motion from single-molecule tracking data of single-stranded DNA through total internal reflection fluorescence microscopy
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Threshold-free evaluation of near-surface diffusion and adsorption-dominated motion from single-molecule tracking data of single-stranded DNA through total internal reflection fluorescence microscopy

机译:通过全内反射荧光显微镜从单链DNA的单分子跟踪数据无阈值评估近表面扩散和吸附主导的运动

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摘要

Total internal reflection fluorescence (TIRF) microscopy enables the single-molecule observation in liquid near substrate surface. However, the evaluation of the diffusion from their individually-tracked positions entails the difficulty in the treatment of molecular adsorption on the substrate. We propose a novel technique to evaluate them, and two types of near-surface Brownian motion were determined for DNA. One is the diffusion near glass surface, and the other is the adsorption-dominated motion, which is also found to be diffusive rather than anchored to the substrate. Our technique does not require the threshold values for the distinction, and even the transition between them can be captured. Objective distinction of Brownian motion with and without adsorption does not require the adsorption-free sample preparation. It is also useful for the characterization of adsorption/desorption kinetics. Our method is not limited to TIRF but applicable to many other systems involving multiple states of Brownian motion. (C) 2015 The Japan Society of Applied Physics
机译:全内反射荧光(TIRF)显微镜使您可以在靠近基材表面的液体中进行单分子观察。但是,对从它们各自追踪的位置的扩散进行评估需要处理在基底上的分子吸附。我们提出了一种新颖的技术来评估它们,并确定了两种类型的近表面布朗运动的DNA。一个是在玻璃表面附近的扩散,另一个是吸附为主的运动,也发现是扩散性的,而不是固定在基板上。我们的技术不需要阈值来区分,甚至可以捕获它们之间的过渡。有和没有吸附的布朗运动的客观区别不需要无吸附的样品制备。它也可用于表征吸附/解吸动力学。我们的方法不限于TIRF,而是适用于涉及布朗运动多个状态的许多其他系统。 (C)2015年日本应用物理学会

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  • 来源
    《Japanese journal of applied physics》 |2015年第12期|125601.1-125601.6|共6页
  • 作者单位

    Tokyo Univ Agr & Technol, Inst Engn, Koganei, Tokyo 1848588, Japan;

    Osaka Univ, Grad Sch Engn Sci, Toyonaka, Osaka 5608531, Japan;

    Osaka Univ, Inst Sci & Ind Res, Osaka 5670047, Japan;

    Osaka Univ, Inst Sci & Ind Res, Osaka 5670047, Japan;

    Osaka Univ, Grad Sch Engn Sci, Toyonaka, Osaka 5608531, Japan;

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