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Numerical analysis of piezoelectric probe for beam forming of longitudinal and shear waves

机译:纵波和横波波束形成压电探头的数值分析

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摘要

In this study, we propose and evaluate an ultrasonic probe for the beam forming of longitudinal and shear waves by the two-dimensional finite element method. Ultrasonic probes for longitudinal and shear waves are used in industrial fields for nondestructive testing. Among the ultrasonic probes, array probes can undertake a range of inspections from a single location, and so are more flexible than single-element probes. Most types of array can be used to produce images at each test location. This allows rapid visualization of the internal structure of a component. In order to restrain artifacts for an ultrasonic array flaw-detecting method, we propose an array probe with three degrees of freedom. Operations of the probe were verified using the two-dimensional finite element method. In the case of transmission, we found that secondarily generated beams that might be artifacts were restrained by controlling the vibration direction of the proposed probes; for reception, an array of proposed probes could obtain the direction of particle displacement. Thus, the results suggest that an array of the proposed probes can distinguish longitudinal from shear waves. (C) 2017 The Japan Society of Applied Physics
机译:在这项研究中,我们提出并评估了一种通过二维有限元方法对纵波和横波形成波束的超声探头。用于纵向和剪切波的超声波探头在工业领域中用于无损检测。在超声波探头中,阵列探头可以从单个位置进行一系列检查,因此比单元素探头更灵活。大多数类型的阵列可用于在每个测试位置生成图像。这样可以快速可视化组件的内部结构。为了抑制超声阵列探伤方法的伪影,我们提出了一种具有三个自由度的阵列探头。使用二维有限元方法验证了探针的操作。在传输的情况下,我们发现通过控制所提出的探头的振动方向可以抑制二次生成的可能是伪影的光束。为了接收,建议的探头阵列可以获取粒子位移的方向。因此,结果表明,所提出的探头阵列可以区分纵向波和剪切波。 (C)2017日本应用物理学会

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  • 来源
    《Japanese journal of applied physics》 |2017年第3期|036601.1-036601.13|共13页
  • 作者单位

    Univ Tsukuba, Grad Sch Syst & Informat Engn, Tsukuba, Ibaraki 3058573, Japan;

    Univ Tsukuba, Fac Engn Informat & Syst, Tsukuba, Ibaraki 3058573, Japan;

    Univ Tsukuba, Fac Engn Informat & Syst, Tsukuba, Ibaraki 3058573, Japan;

    Univ Tsukuba, Fac Engn Informat & Syst, Tsukuba, Ibaraki 3058573, Japan;

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