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Evaluation of Heterogeneity in Thickness of Passive Films on Pure Iron by Scanning Electrochemical Microscopy

机译:扫描电化学显微镜评估纯铁钝化膜厚度的异质性

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Scanning electrochemical microscopy (SECM) was applied to evaluate the heterogeneity of a passive film formed on a pure iron electrode in deaerated pH 8.4 borate solution. A probe current image of SECM solution containing 0.03 mol dm~(-3) Fe(CN)~(4-)_6 as a mediator. The difference in thickness of passive films formed on two iron plates at different potentials could be evaluated from the probe current image. The probe current image of the passivated iron surface with distinctive crystal grains was composed of the patch patterns, the shapes of which coincided completely with the shapes of the substrate crystal grains. The probe current flowed above the grain surface oriented to {100} plane was less than that above the grain surface oriented to {110} or {110} plane. The grain orientation dependence fo probe current was ascribed to the difference in thickness of passive films formed on the crystal grains.
机译:扫描电化学显微镜(SECM)用于评估在纯铁电极上在8.4 pH的脱硼硼酸盐溶液中形成的钝化膜的异质性。含有0.03 mol dm〜(-3)Fe(CN)〜(4-)_ 6作为介体的SECM溶液的探针电流图像。可以从探针电流图像评估在两个铁板上以不同电势形成的钝化膜厚度的差异。具有独特晶粒的钝化铁表面的探针电流图像由斑块图案组成,其形状与基底晶粒的形状完全一致。在朝向{100}面的晶粒表面上方流动的探针电流小于朝向{110}或{110}面的晶粒表面上方的探针电流。探针电流的晶粒取向依赖性归因于在晶粒上形成的钝化膜的厚度差异。

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