An integrated approach for process monitoring using wavelet analysis and competitive neural network

摘要

A novel framework involving both a detection module and a classification module is proposed for the recognition of the six main types of process signals. In particular, a multi-scale wavelet filter is used for denoising and its performance is compared with that of single-scale linear filters. Moreover, two kinds of competitive neural networks, based on learning vector quantization (LVQ) and adaptive resonance theory (ART), are adopted for the task of pattern classification and benchmarking. Our results show that denoising through a wavelet filter is best for pattern classification, and the classification accuracy with respect to six predefined categories using a LVQ-X network is a little better than using an ART network. However, when an unexpected novel pattern occurs within the process, LVQ will force the novel pattern to be classified into one of those predefined categories that is most similar to the novel pattern. On the contrary, ART will automatically construct a new class when the similarity measured between the novel pattern and the most similar category is too small to be incorporated. Therefore, under the consideration of the stability-plasticity dilemma, our simplified ART network based on multi-scale wavelet denoising provides a more promising way to adapt unexpected novel patterns.