Simulation Of Near-tip Crack Behaviour And Its Correlation To Fatigue Crack Growth With A Modified Strip-yield Model

摘要

A modified strip-yield model has been developed to simulate the plasticity-induced crack closure under the constant amplitude (CA) and a single overload loading conditions. The paper focuses on the simulation of the near tip crack profiles and stress distributions during the fatigue process. Detailed information on near-tip stress and displacement fields at the maximum load (P_(max)), the minimum load (P_(min)), and the crack opening load (P_(op)) of a fatigue load cycle have been presented. The correlation of the crack closure to the near-tip material fatigue damage has been investigated and used to rationalise the crack growth behaviour under the CA and a single overload loading conditions.