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Thermal contact resistance at low contact pressure: Effect of elastic deformation

机译:低接触压力下的热接触电阻:弹性变形的影响

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摘要

Existing models over-predict the thermal contact resistance of conforming rough joints at low contact pressures. However, the applicable pressure range in some applications such as microelectronics cooling is low. A new model is developed which is more suitable for low pressures. The effect of elastic deformations beneath the plastically deformed microcontacts is determined by superimposing normal deformations due to self and neighboring contact spots in an elastic half-space. A parametric study reveals that the elastic deformation effect is an important phenomenon at low contact pressures. The model is compared with data and good agreement is observed at low contact pressures.
机译:现有模型过高地预测了在低接触压力下合格的粗糙接头的热接触电阻。但是,在某些应用中(例如微电子冷却)的适用压力范围很低。开发了一种更适合低压的新型号。可塑性变形的微触点下方的弹性变形的影响是通过叠加由于自身和相邻接触点在弹性半空间中叠加的法向变形来确定的。参数研究表明,弹性变形效应是低接触压力下的重要现象。将模型与数据进行比较,并在低接触压力下观察到良好的一致性。

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