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Indentation and imprint mapping for the identification of interface properties in film-substrate systems

机译:压痕和压印映射,用于识别薄膜-基材系统中的界面特性

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摘要

Indentation tests are frequently employed at present for the identification of material parameters at different scales. An innovative inverse analysis technique, recently proposed by the Authors, combines the traditional indentation test with the mapping of the residual deformations (imprint), thus providing experimental data apt to be used to identify material parameters in film-substrate systems. In this paper, such methodology is enhanced to permit the identification of the fracture properties of the interface between a coating and its substrate once the bulk material parameters are known. In order to make the inverse problem well posed, a further set of experimental data, namely the horizontal displacement field measured on the film external surface, is considered as available experimental information. The sought material parameters are recovered through recursive calculations of the mechanical response of the film-substrate system, performed by a finite strain numerical simulation. The coating and a significant portion of the underlying bulk material are incorporated in the finite element models built up to this purpose, while delamination is accounted for through cohesive elements. The inverse analysis procedure rests on a batch, deterministic approach and conventional optimization algorithms are employed for the minimization of a suitably defined discrepancy norm. Extensive numerical computations have been performed in order to test the performance of the proposed methodology in terms of result accuracy and computational effort.
机译:目前,经常采用压痕测试来识别不同规模的材料参数。作者最近提出了一种创新的逆分析技术,该技术将传统的压痕测试与残余变形(压印)的映射相结合,从而提供了易于识别膜-基材系统中材料参数的实验数据。在本文中,对这种方法进行了改进,以便一旦已知散装材料参数,即可识别涂层与其基材之间的界面的断裂特性。为了使反问题很好地解决,将另一组实验数据,即在薄膜外表面上测量的水平位移场,视为可用的实验信息。通过有限应变数值模拟对薄膜-基材系统的机械响应进行递归计算,可以恢复所需的材料参数。为此目的而建立的有限元模型中包含了涂层和下面的大部分散装材料,而分层是通过内聚元素进行的。逆分析过程基于批处理,确定性方法,并且采用常规优化算法来最小化适当定义的差异范数。为了测试所提出方法论在结果准确性和计算量方面的性能,已经进行了广泛的数值计算。

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