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Effects of algorithmic simulation parameters on the prediction of extreme value fatigue indicator parameters in duplex Ti-6A1-4V

机译:算法仿真参数对Duplex Ti-6a1-4V中极值疲劳指示器参数预测的影响

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Fatigue Indicator Parameters (FIPs) serve as surrogate measures of the driving force to form and grow trans-granular fatigue cracks in metals and alloys. FIPs are volume averaged over sub-grain regions using a crystal plasticity finite element method (CPFEM) model of polycrystalline microstructures. Questions naturally arise regarding the ability to computationally simulate a sufficient volume of microstructure samples to objectively build a converged estimate of the distribution of maximum FIPs above some threshold, referred to as an Extreme Value Distribution (EVD). A reliable EVD can be estimated by considering FIPs computed from samples comprised of a sufficient number of grains. A recently developed statistical technique is exploited in this work to predict the maximum FIPs in a large volume of duplex Ti-6A1-4V. Effects of several crucial algorithmic parameters in the CPFEM simulations are explored, including the sub-grain FIP averaging volume, the statistical volume element (SVE) size of each microstructure instantiation, number of SVEs necessary to project extreme value FIPs for larger volumes, and finite element mesh density. The SVE size defines the number of grains in a single simulation and therefore controls the number of nearest and second nearest neighbor grain interactions that dominate FIP EVDs. This interplays closely with the number of SVEs needed to establish reliable estimates of FIP EVDs for larger volumes of microstructure. We demonstrate that the number of grains sampled is a critical consideration in these types of CPFEM simulations aimed at EVDs. The statistical technique for estimation of EVD FIPs is relatively insensitive to both the SVE size and mesh density of a single simulation, provided a sufficient number of individual grains are sampled to capture dominant effects of microstructure heterogeneity. Furthermore, averaging FIPs over different sub-grain volumes results in consistent predictions of the maximum FIPs.
机译:疲劳指示器参数(FIPS)用作制动力的替代措施,以在金属和合金中形成和生长反式颗粒疲劳裂缝。 FIPS使用多晶硅微结构的晶体可塑性有限元方法(CPFEM)模型在亚粒区域上的体积平均。关于计算地模拟足够大量的微结构样本的能力,自然地出现的问题,以客观地构建大于一些阈值的最大fips分布的收敛估计,称为极值分布(EVD)。可以通过考虑从由足够数量的晶粒组成的样品计算的FIPS来估计可靠的EVD。在这项工作中利用最近开发的统计技术,以预测大量的双工Ti-6a1-4v中的最大屈服。探索了若干关键算法参数在CPFEM模拟中的影响,包括子谷物FIP平均量,每个微结构实例的统计容量元素(SVE)大小,为更大的卷投影极值FIPS所需的SVEVE数,以及有限元素网格密度。 SVE尺寸定义了单个模拟中的谷物的数量,因此控制占FIP EVDS的最近最近邻晶晶互动的数量。这种相互作用与建立可靠估计的FIP EVDS所需的SVERS相互相互相互作用。我们证明,取样的谷物数量是针对旨在EVDS的这些类型的CPFEM模拟中的批判性考虑因素。估计EVD FIPS的统计技术对单个模拟的SVE尺寸和网状密度均相对不敏感,提供了足够数量的单独的晶粒以捕获微结构异质性的显性效果。此外,在不同的子晶卷上的平均架构导致最大FIP的一致预测。

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