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Electrothermal Stability Of Uniform Arrays Of One-port Elements

机译:一端口单元均匀阵列的电热稳定性

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Power electronic elements are often built employing arrays of devices designed to evenly share high currents over a large number of single devices. In some situations, mismatch in current sharing can occur causing temperature differences between elements of the array. These differences can trigger electrothermal instability phenomena and even device destruction. In this paper, we consider the electrothermal dynamic behavior of arrays composed of identical one-port elements. We first introduce a simplified model of the thermal paths and of the elements composing the array that allows the analysis of the behavior of the electrothermal system. Then, we investigate from a mathematical standpoint dynamic effects governing current sharing and possible situations causing hot spots with consequent device destruction. These results are compared with simulations of detailed non-linear models confirming predictions given by the simplified model.
机译:功率电子元件通常采用被设计为在大量单个设备上均匀共享大电流的设备阵列来构建。在某些情况下,会发生电流分配不匹配,从而导致阵列元件之间的温度差异。这些差异可能触发电热不稳定性现象,甚至损坏器件。在本文中,我们考虑了由相同的单端口元素组成的阵列的电热动力学行为。我们首先介绍热路径和组成数组的元素的简化模型,该模型允许分析电热系统的行为。然后,我们从数学角度研究了控制电流共享和可能引起热点并导致设备损坏的动态情况的动态效应。将这些结果与详细的非线性模型的仿真进行比较,确认简化模型给出的预测。

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