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On Calibration and Direction Finding with Uniform Circular Arrays

机译:用均匀圆形阵列校准和方向查找

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摘要

Antenna array calibration methods and narrowband direction finding (DF) techniques will be outlined and compared for a uniform circular array. DF is stated as an inverse problem, which solution requires a parametric model of the array itself. Because real arrays suffer from mechanical and electrical imperfections, analytic array models are per se not applicable. Mitigation of such disturbances by a global calibration matrix will be addressed, and methods to estimate this calibration matrix will be recapped from literature. Also, a novel method will be presented, which circumvents the problem of a changed noise statistic due to calibration. Furthermore, local calibration, where array calibration measurements are incorporated in the DF algorithm, is considered as well. Common DF algorithms will be outlined, their assumptions regarding array properties will be addressed, and required preprocessing steps such as the beam-space transformation will be presented. Also, two novel DF techniques will be proposed, based on the Capon beamformer, but with reduced computational effort and higher resolution for bearing estimation. Simulations are used to exemplary compare calibration and DF methods in conjunction with each other. Furthermore, measurements with a single and two coherent sources are considered. It turns out that global calibration enables computational efficient DF algorithms but causes biased estimates. Furthermore, resolution of two coherent sources necessitates array calibration.
机译:将概述天线阵列校准方法和窄带方向找到(DF)技术,并比较均匀圆形阵列。 DF被说明为逆问题,该解决方案需要阵列本身的参数模型。由于真实阵列遭受机械和电气缺陷,因此分析阵列模型是不适用的。将解决通过全局校准矩阵的这种干扰的减轻,并且估计该校准矩阵的方法将从文献中重新映射。此外,将呈现一种新的方法,这将避免由于校准而改变的噪声统计问题。此外,还考虑了DF算法中的局部校准,其中阵列校准测量结合在一起。将概述常见的DF算法,将解决其关于阵列属性的假设,并呈现诸如波束空间变换的所需预处理步骤。而且,基于Capon波束形成器提出了两种新型DF技术,但是通过降低的计算工作和更高的轴承估计的分辨率。模拟用于彼此结合使用校准和DF方法。此外,考虑用单个和两个相干源进行测量。事实证明,全局校准使计算有效的DF算法能够实现偏置估计。此外,两个相干源的分辨率需要阵列校准。

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  • 来源
    《International journal of antennas and propagation》 |2019年第2期|1523469.1-1523469.12|共12页
  • 作者单位

    Tech Univ Ilmenau Elect Measurements & Signal Proc Grp D-98684 Ilmenau Germany;

    Tech Univ Ilmenau Elect Measurements & Signal Proc Grp D-98684 Ilmenau Germany;

    Tech Univ Ilmenau Elect Measurements & Signal Proc Grp D-98684 Ilmenau Germany;

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