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FPGA-based test bed for measurement of AM/AM and AM/PM distortion and modeling memory effects in RF PAs

机译:基于FPGA的测试平台,用于测量AM / AM和AM / PM失真并建模RF PA中的存储器效应

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摘要

Using a field-programmable gate array (FPGA) development board, a digital signal processor (DSP) builder, and the phase-to-amplitude conversion principle, a low-cost system for measuring the amplitude-to-amplitude (AM/AM) and amplitude-to-phase (AM/PM) distortion curves of radio frequency (RF) power amplifiers (PAs) is presented. The state of the art based on the measurements and preliminary studies of AM/AM and AM/PM distortion curves is discussed. A full digital control of the test bed simulated/emulated in Matlab/Simulink is introduced to recalculate the known AM/AM and AM/PM measurements stored as look-up table (LUT). Finally, the low-cost system comprises the memory polynomial model (MPM) that involves the nonlinearity order and memory effects of real PAs. (C) 2015 Elsevier B.V. All rights reserved.
机译:使用现场可编程门阵列(FPGA)开发板,数字信号处理器(DSP)生成器和相位到幅度转换原理,这是一种用于测量幅度到幅度(AM / AM)的低成本系统给出了射频(RF)功率放大器(PA)的幅度-相位(AM / PM)失真曲线。讨论了基于AM / AM和AM / PM失真曲线的测量和初步研究的最新技术。引入了在Matlab / Simulink中模拟/仿真的测试台的全数字控制,以重新计算存储为查找表(LUT)的已知AM / AM和AM / PM测量值。最后,该低成本系统包括存储器多项式模型(MPM),该模型涉及实际PA的非线性顺序和存储器效应。 (C)2015 Elsevier B.V.保留所有权利。

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