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Design space exploration of low-power flip-flops in FinFET technology

机译:FINFET技术低功耗触发器的设计空间探索

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摘要

As technology evolves, new devices emerge to overcome the known short-channel effects of conventional MOSFETs. FinFETs, as recent devices, are widely used in modern processor designs. Elaborate design of circuit elements can effectively increase the overall chip performance. In this paper we studied the design of high performance flip-flop (FF) using FinFET devices. We have investigated several transistor sizing methods in FinFET technology to design the FF circuit based on different input and output capacitances. The results indicate that the circuit designed using minimum-energy-delay-area product (min-EDAP) approach has the lowest PDP. We developed a modified logical effort approach that leads to a minimum EDP design compared to the other approaches. The performance of flip-flop is also investigated based on the metrics extracted from energy efficient curve (EEC). Results show that the ED metric has the minimum EDP in all cases. Moreover, the E 4 D metric shows the least variations against frequency and voltage fluctuations, while the ED 4 metric is more robust against temperature variations. Simulations are performed using HSPICE in 16 nm FinFET technology with shorted-gate (SG) mode configuration.
机译:随着技术的发展,新设备出现克服传统MOSFET的已知短信效果。作为最近的设备,FinFET广泛用于现代处理器设计。精心设计的电路元件可以有效地提高整体芯片性能。在本文中,我们使用FinFET器件研究了高性能触发器(FF)的设计。我们在FinFET技术中调查了几种晶体管尺寸方法,基于不同输入和输出电容设计FF电路。结果表明,使用最小能量 - 延迟区域产品(MIN-EDAP)方法设计的电路具有最低PDP。我们开发了一种改进的逻辑工作方法,与其他方法相比,导致最低EDP设计。还基于从节能曲线(EEC)中提取的度量来研究触发器的性能。结果表明,ED指标在所有情况下都具有最低EDP。此外,E 4 D度量显示频率和电压波动的最小变化,而ED 4度量更加稳健地对温度变化。使用带有短路门(SG)模式配置的16 NM FinFET技术中的HSPICE进行仿真。

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