Spectroscopic Ellipsometry Characterization of Optical Properties for Ti-Doped SiO₂ Mesoporous Films

摘要

Ti-doped SiO₂ Mesoporous films were synthesized by sol-gel process using surfactant cetyltrimethyl ammonium bromide as the template. Spectroscopic ellipsometer and UV-VIS spectrophotometer were used to characterize the optical properties. The Cauchy model is presented well in fitting spectroscopic ellipsometric data for the optical constants. The relation between miscrostructure, optical constants and optical character are discussed. The results show that Ti+4 cations have no effect on the dispersion relation of the films while they have obvious effect on the value of the optical constants. The refractive index is inversely proportional to the porosity of the films.View full textDownload full textRelated var addthis_config = { ui_cobrand: "Taylor & Francis Online", services_compact: "citeulike,netvibes,twitter,technorati,delicious,linkedin,facebook,stumbleupon,digg,google,more", pubid: "ra-4dff56cd6bb1830b" }; Add to shortlist Link Permalink http://dx.doi.org/10.1080/10584587.2011.575289