Optimal Dual-Tone Frequency Selection for ADC Sine-Wave Tests

摘要

An automated frequency selection algorithm for dual-tone analog-to-digital converter sine-wave test that guarantees optimal test coverage in the phase-plane is presented. The proposed method relaxes some constraints of the existing phase-space design methodology. This enables wider application of the phase-space method in test frequency selection. The proposed algorithm also extends the previous works by generating a good frequency pair while taking into account various hardware constraints in the production environment. Quality measures for phase-plane coverage is proposed and evaluated, followed by the theoretical analysis and description of the phase-plane uniformity. Extensive computer simulation is carried out to validate the proposed technique.