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Effects of metallic gates on AC measurements of the quantum Hall resistance

机译:金属门对量子霍尔电阻AC测量的影响

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Using a sample with a split back gate, a linear frequency dependence of the AC quantum Hall resistance (QHR) was observed. The frequency coefficient, which is due to dielectric losses produced by leakage current between the two-dimensional electron gas (2DEG) and the back gates, can be turned from a positive to a negative value by increasing the back-gate voltage. More interestingly, by removing these back gates, the losses can be considerably reduced, leading to a residual frequency coefficient on the order of (0.03/spl plusmn/0.03)/spl times/10/sup -6//kHz. Moreover, at 1 kHz, an extremely flat plateau was observed over a magnetic field range of 1.4 T. These results clearly indicate that the audio frequency dependence of the QHR is to a large extent related to the measurement apparatus and does not originate from the physical transport properties of the 2DEG.
机译:使用带有裂背栅的样品,观察到了交流量子霍尔电阻(QHR)的线性频率依赖性。频率系数是由于二维电子气(2DEG)与背栅之间的泄漏电流产生的介电损耗所致,可以通过增加背栅电压将其从正值变为负值。更有趣的是,通过去除这些后栅极,可以显着降低损耗,从而导致残余频率系数约为(0.03 / spl plusmn / 0.03)/ spl乘以/ 10 / sup -6 // kHz。此外,在1 kHz下,在1.4 T的磁场范围内观察到非常平坦的平台。这些结果清楚地表明,QHR的音频依赖性在很大程度上与测量设备有关,而不是源于物理2DEG的传输特性。

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