Dynamic testing and diagnostics of digitizing signal analyzers

摘要

A dynamic testing method for effective bit number evaluation of digitizing signal analyzers is introduced. The technique is valid when, owing to particular working conditions, only a limited number of the sinewave test signal periods can be collected. In such a case other test methodologies can present problems for a correct application. The proposed method is based on a regression algorithm, and by virtue of using the acquisition of a sinewave test signal for a time interval enclosing only three zero crossings of the sinewave, requires a very short computational time. After a brief summary of existing test methodologies, the performances and limits of the proposed method are analyzed and highlighted. To illustrate the application field of the described methodology, preliminary simulated results arising from several devices and real data relative to one digitizer are reported.