Effects of Uncertainty of Excitation Condition on Error of Method of Fundamental Parameters in X-ray Fluorescence Analysis

摘要

The errors of the method of fundamental parameters in X-ray analysis due to deviation of device characteristics (anode voltage, angles of incidence of the primary radiation and the take-off the fluorescence, thickness of anodic coatings of X-ray tubes of the shot type, and purity of the exciting spectrum) from those used in the calculation of the nominal values are considered. It is shown that the contribution of these errors can reach 0.5-1 rel. % for the uncertainties in units of the fundamental parameters that are typical of X-ray equipment and for a significant difference in the composition of the analyzed and standard samples (particularly when "pure metals" and a nonlinear calibration functions are used as reference samples), which is especially important for high-precision determination of the main components.