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Order parameter dimensionality, resistivity and transition temperature in pure and zinc doped YBa_2Cu_3O_(7-y) thin films

机译:纯锌掺杂YBa_2Cu_3O_(7-y)薄膜的有序参数尺寸,电阻率和转变温度

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摘要

In pure and 0.33% Zn doped (at Cu-site) c-axis oriented laser ablated epitaxial thin films of YBa_2Cu_3O_(7-y) superconductors the excess conductivity, order parameter dimensionality (δ) and the effects of their variation on dimensionality cross-over have been studied. Relative to the dimensionality crossover in pure film the Zn doped film shows fast suppression of superconductivity fluctu-ations. Comparison with other studies indicates: (1) high mean field critical temperature (T_c~(mf)) does not necessarily imply that ρ(T) will be less; (2) for pure films, crossover correlates more with ρ(T) than T_c~(mf); (3) in Zn doped sample order parameter dimensionality δ has an uncertain correlation with ρ(T), but the pure films have an inverse variation; (4) in pure and Zn doped samples δ is directly proportional to T_c~(mf). These suggest inverse correlation between T_c~(mf) and resistivity in the pristine system, which is absent in the case of Zn doped sample.
机译:在纯的和0.33%的Zn掺杂(在Cu处)的YBa_2Cu_3O_(7-y)超导体的c轴定向激光烧蚀外延薄膜中,过量电导率,有序参数尺寸(δ)及其变化对尺寸交叉的影响超过已研究。相对于纯膜中的尺寸跨度,Zn掺杂膜显示出超导波动的快速抑制。与其他研究的比较表明:(1)高平均场临界温度(T_c〜(mf))不一定意味着ρ(T)会更小; (2)对于纯膜,交叉与ρ(T)的相关性大于T_c〜(mf); (3)在Zn掺杂的样品中,阶次参数的维数δ与ρ(T)具有不确定的相关性,但纯膜具有相反的变化; (4)在纯锌样品中,δ与T_c〜(mf)成正比。这些表明原始体系中的T_c〜(mf)与电阻率成反比,而在掺杂锌的样品中则没有。

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