首页> 外文期刊>IEICE Transactions on Information and Systems >A Leakage Efficient Data TLB Design for Embedded Processors
【24h】

A Leakage Efficient Data TLB Design for Embedded Processors

机译:嵌入式处理器的高效泄漏数据TLB设计

获取原文
获取原文并翻译 | 示例
       

摘要

This paper presents a leakage efficient data TLB (Translation Look-aside Buffer) design for embedded processors. Due to the data locality in programs, data TLB references tend to hit only a small number of pages during short execution intervals. After dividing the overall execution time into smaller time slices, a leakage reduction mechanism is proposed to detect TLB entries which actually serve for virtual-to-physical address translations within each time slice. Thus, with the integration of the dual voltage supply technique, those TLB entries which are not used for address translations can be put into low leakage mode (with lower voltage supply) to save power. Evaluation results with eight MiBench programs show that the proposed design can reduce the leakage power of a data TLB by 37% on average, with performance degradation less than 0.01 %.
机译:本文提出了一种用于嵌入式处理器的高效泄漏数据TLB(转换后备缓冲器)设计。由于程序中的数据局部性,在较短的执行时间间隔内,数据TLB引用往往只命中少量页面。将整个执行时间划分为较小的时间片后,提出了一种减少泄漏的机制来检测实际上在每个时间片内用于虚拟地址到物理地址转换的TLB条目。因此,通过集成双电压供电技术,可以将那些不用于地址转换的TLB条目置于低泄漏模式(采用较低的电压供电)以节省功耗。八个MiBench程序的评估结果表明,所提出的设计可将数据TLB的泄漏功率平均降低37%,而性能下降小于0.01%。

著录项

  • 来源
    《IEICE Transactions on Information and Systems》 |2011年第1期|p.51-59|共9页
  • 作者单位

    The authors are with the Faculty of Science and Technology,Keio University, Yokohama-shi, 223-0061 Japan;

    The authors are with the Faculty of Science and Technology,Keio University, Yokohama-shi, 223-0061 Japan;

    The authors are with the Faculty of Science and Technology,Keio University, Yokohama-shi, 223-0061 Japan;

    The authors are with the Department of Computer and Information Sciences, Tokyo University of Agriculture and Technology,Koganei-shi, 184-8588 Japan;

    The authors are with the Department of Computer and Information Sciences, Tokyo University of Agriculture and Technology,Koganei-shi, 184-8588 Japan;

    The authors are with the Faculty of Science and Technology,Keio University, Yokohama-shi, 223-0061 Japan;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    leakage power; TLB; embedded processor;

    机译:泄漏功率TLB;嵌入式处理器;
  • 入库时间 2022-08-18 00:26:41

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号