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Reliability Modeling of Declustered-Parity RAID Considering Uncorrectable Bit Errors

机译:考虑不可校正的位错误的奇偶校验RAID的可靠性建模

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摘要

UNcorrectable Bit Errors (UNBEs) are important in considering the reliability of Redundant Array of Inexpensive Disks (RAID). They, however, have been ignored or have not been studied in detail in existing reliability analysis of RAID. In this paper, we present an analytic model to study the reliability of declustered-parity RAID by considering UNBEs. By using the analytic model, the optimistic and the pessimistic estimates of the probability that data loss occurs due to an UNBE during the data reconstruction after a disk failed (we call this DB data loss) are obtained. Then, the optimistic and the pessimistic estimates of the Mean Time To Data Loss (MTTDL) that take into account both DB data loss and the data loss caused by double independent disk failures (we call this DD data loss) are obtained. Furthermore, how the MTTDL depends on the number of units in a parity stripe, rebuild time of a failed disk and write fraction of data access are studied by numerical analysis.
机译:在考虑廉价磁盘冗余阵列(RAID)的可靠性时,不可纠正的位错误(UNBE)非常重要。但是,它们在现有的RAID可靠性分析中已被忽略或未进行详细研究。在本文中,我们提出了一种分析模型,通过考虑UNBE来研究奇偶校验RAID的可靠性。通过使用解析模型,可以获得磁盘故障后数据重构期间因UNBE导致数据丢失的概率的乐观估计和悲观估计(我们将此称为DB数据丢失)。然后,获得考虑到DB数据丢失和双重独立磁盘故障(称为DD数据丢失)引起的数据丢失的平均数据丢失时间(MTTDL)的乐观估计和悲观估计。此外,通过数值分析研究了MTTDL如何依赖于奇偶校验条带中的单元数,故障磁盘的重建时间以及数据访问的写入部分。

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