首页> 外文期刊>IEICE Transactions on Electronics >Electric-Field Scanning System Using Electro-Optic Sensor
【24h】

Electric-Field Scanning System Using Electro-Optic Sensor

机译:使用光电传感器的电场扫描系统

获取原文
获取原文并翻译 | 示例
           

摘要

To perform a high-speed measurement of a two-dimensional electric-field distribution, we developed an electric-field scanning system using a large-aperture electro-optic crystal and a laser-beam scanner. In the system, a two-dimensional electric-field image projected onto the crystal is read off using beam scanning through an electro-optic effect. With the imaging system, only 20 to 40 seconds are needed to obtain both millimeter-wave amplitude and phase images of a 20 x 30mm area with a pixel spacing of 0.5mm. We measured radiation patterns of a 10-GHz dipole antenna and compared them with simulation results to investigate a disturbance of the patterns inside the crystal. Profiles of a 120-GHz millimeter-wave beam were also measured to determine the effects of a dielectric lens used to focus the beam. Furthermore, we applied the system to imaging several objects with 180-GHz millimeter waves and experimentally showed that it is a valid means for a non-destructive inspection of hidden objects.
机译:为了进行二维电场分布的高速测量,我们开发了一种使用大孔径电光晶体和激光束扫描仪的电场扫描系统。在该系统中,使用通过电光效应的光束扫描来读取投影到晶体上的二维电场图像。使用成像系统,只需20到40秒即可获得20 x 30mm区域的毫米波振幅和相位图像,像素间距为0.5mm。我们测量了10 GHz偶极天线的辐射方向图,并将其与仿真结果进行比较,以研究晶体内部方向图的干扰。还测量了120 GHz毫米波光束的轮廓,以确定用于聚焦光束的介电透镜的效果。此外,我们将该系统应用于180 GHz毫米波的多个物体的成像,并通过实验证明这是对隐藏物体进行无损检查的有效手段。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号