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A 130-nm CMOS 95-mm~2 1-Gb Multilevel AG-AND-Type Flash Memory with 10-MB/s Programming Throughput

机译:具有10MB / s编程吞吐量的130nm CMOS 95mm〜2 1Gb多层AG-AND型闪存

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摘要

A 1-Gb AG-AND flash memory has been fabricated using 0.13-μm CMOS technology, resulting in a cell area of 0.104 μm~2 and a chip area of 95.2 mm~2. By applying constant-charge-injection programming and source-line-select programming, a fast page programming time of 600 μs is achieved. The four-bank operation attains a fast programming throughput of 10 MB/s in multilevel flash memories. The compact SRAM write buffers reduce the chip area penalty. A rewrite throughput of 8.3 MB/s is achieved by means of the RAM-write operation during the erase mode.
机译:已经使用0.13-μmCMOS技术制造了1-Gb AG-AND闪存,其单元面积为0.104μm〜2,芯片面积为95.2 mm〜2。通过应用恒定电荷注入编程和源极线选择编程,可以实现600μs的快速页面编程时间。四排操作在多层闪存中实现了10 MB / s的快速编程吞吐量。紧凑的SRAM写缓冲器减少了芯片面积损失。通过在擦除模式下进行RAM写操作,可以实现8.3 MB / s的重写吞吐量。

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