Defect Detection Of Tft-lcd Image Using Adapted Contrast Sensitivity Function And Wavelet Transform

摘要

The thin film transistor liquid crystal display (TFT-LCD) image has nonuniform brightness, which is a major difficulty in finding the Mura defect region. To facilitate Mura segmentation, globally widely varying background signal must be flattened and then Mura signal must be enhanced. In this paper, Mura signal enhancement and background-signal-flattening methods using wavelet coefficient processing are proposed. The wavelet approximation coefficients are used for background-signal flattening, while wavelet detail coefficients are employed to magnify the Mura signal on the basis of an adapted contrast sensitivity function (CSF). Then, for the enhanced image, trimodal thresholding segmentation technique and a false-region elimination method based on the human visual system (HVS) are employed for reliable Mura segmentation. The experimental results show that the proposed algorithms produce promising results and can be applied to automated inspection systems for finding Muras in a TFT-LCD image.