A Diagnosis Testbench of Analog IP Cores for Characterization of Substrate Coupling Strength

摘要

A diagnosis testbench of analog IP cores characterizes their coupling strengths against on-chip environmental disturbances, specifically with regard to substrate voltage variations. The testbench incorporates multi-tone digital noise generators and a precision waveform capture with multiple probing channels. A prototype test bench fabricated in a 90-nm CMOS technology demonstrates the diagnosis of substrate coupling up to 400 MHz with dynamic range of more than 60 dB. The coefficients of noise propagation as well as noise coupling on a silicon substrate are quantitatively derived for analog IP cores processed in a target technology, and further linked with noise awared EDA tooling for the successful adoption of such IP cores in SoC integration.