An Integer Programming Formulation for Generating High Quality Transition Tests

摘要

This paper describes a test generation method to derive high quality transition tests for combinational circuits. It is known that, for a transition fault, two-pattern tests which propagate the errors to all the primary outputs reachable from the fault site can enhance the detectability of unmodeled defects. In this paper, to generate high quality transition tests, the test generation problem is formulated as a problem of integer linear programming, where a metric expressing the above fact is optimized. The proposed formulation guarantees that minimum two-pat­tern tests for a transition fault are generated such that the errors are observed at all the primary outputs reachable from the fault site.