机译:圆柱型半导体釉瓷绝缘子的污闪电压性能评估方法
Department of Electrical Engineering, Chubu University 1200, Matsumoto-cho, Kasugai, Aichi 487-8501;
Department of Electrical Engineering, Chubu University 1200, Matsumoto-cho, Kasugai, Aichi 487-8501;
Department of Electrical Engineering, Chubu University 1200, Matsumoto-cho, Kasugai, Aichi 487-8501;
Department of Electrical Engineering, Chubu University 1200, Matsumoto-cho, Kasugai, Aichi 487-8501;
Department of Electrical Engineering, Chubu University 1200, Matsumoto-cho, Kasugai, Aichi 487-8501;
NGK High Voltage Laboratory, NGK Insulators, Ltd. Futaebori, Komaki, Aichi 485-8566;
NGK High Voltage Laboratory, NGK Insulators, Ltd. Futaebori, Komaki, Aichi 485-8566;
contamination; flashover voltage; semi-conducting glaze; cold-wet: switch-on; wetting;
机译:圆柱形聚合物绝缘子芯径对污染闪络电压的影响-第二部分
机译:各种类型的瓷,玻璃和复合绝缘子的直流污染闪络性能比较
机译:架空输电线路积雪绝缘子的闪络电压特性评估,第III部分-积雪绝缘子的154 kv满量程闪络电压试验-
机译:圆柱型半导体釉瓷绝缘子的污闪电压性能评估方法
机译:直流电压下绝缘子的闪络机理和实验室评估。
机译:高压传输线绝缘子中金属污染分布的激光诱导击穿光谱(LIBS)检测
机译:自然污染对大污染区域瓷绝缘子污染闪络电压波形的影响