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Capacitively Coupled RF Discharge Breakdown in Gas Mixtures

机译:混合气体中的电容耦合射频放电击穿

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The RF (13.56 MHz) gas breakdown in Ne-N_2, Ne-Ar and He-N_2 mixture systems are investigated experimentally in a parallel plate capacitively coupled device with varying the pressure, the mixing ratio and the electrode separation, specifically focussing on the breakdown at the small values of the mixing ratio. The breakdown voltage curves obtained have the V-shaped or L-shaped characteristics. The breakdown voltage decreases with the addition of a small amount of N_2 or Ar in each mixture system, and the ratios of decrease in breakdown voltage to rare gas breakdown voltage in these mixture sysytems are about 22, 32 and 30 % at the maximum, respectively. The decrease of breakdown voltage is observed in a certain restricted pressure range, which is narrower in Ne-N_2 system than in Ne-Ar one. This feature in Ne-N_2 system is probably due to the decrease of electron energy attributed to the vibrational excitation of N_2 by electron impact. Compared with the DC breakdown and the microwave one, the decrease ratio in the RF breakdown is relatively small, suggesting that there exist some competitive ionization processes accompanied by excited particles including the Penning ionization.
机译:在平行板电容耦合器件中,通过改变压力,混合比和电极间距,对Ne-N_2,Ne-Ar和He-N_2混合系统中的RF(13.56 MHz)气体击穿进行了实验研究,重点是击穿在较小的混合比值下。获得的击穿电压曲线具有V形或L形的特性。在每个混合系统中,随着少量N_2或Ar的加入,击穿电压降低,并且在这些混合系统中,击穿电压的降低与稀有气体击穿电压的最大比例分别约为22%,32%和30%。 。在一定的限制压力范围内观察到击穿电压的降低,在Ne-N_2系统中,该范围比在Ne-Ar中更窄。 Ne-N_2系统中的这一特征可能是由于电子撞击导致N_2振动激发而导致的电子能量下降。与直流击穿和微波击穿相比,射频击穿的减少率相对较小,表明存在一些竞争性的电离过程,伴随着包括潘宁电离在内的受激粒子。

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