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首页> 外文期刊>IEEE Transactions on Reliability >Degradation Modeling Based on a Time-Dependent Ornstein-Uhlenbeck Process and Residual Useful Lifetime Estimation
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Degradation Modeling Based on a Time-Dependent Ornstein-Uhlenbeck Process and Residual Useful Lifetime Estimation

机译:基于时间依赖的Ornstein-Uhlenbeck过程的退化建模和剩余使用寿命寿命估计

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In this paper, how to estimate residual useful lifetime (RUL) is discussed based on a model-based method when fluctuations exist in the degradation process around its average behavior. The main idea is to model the degradation process as a time-dependent Ornstein-Uhlenbeck (OU) process, where the first passage failure is adopted to consider corresponding RUL estimation. The time-dependent OU process is proved good by its statistical properties on the controllable mean, variance, and correlation. Its mean-reverting property is introduced to interpret temporary correlated fluctuations from an overall degrading trend in degradation records. The corresponding parameter estimation is proposed based on the maximum likelihood estimation method, and a Volterra integral equation of second kind with a non-singular kernel is then considered to calculate the probability density function (pdf) of failure time. Proposed methods are tested in a case study, where results are compared with a nonlinear-drift, linear-diffusion process.
机译:在本文中,当基于平均行为的退化过程中存在波动时,基于模型的方法讨论了如何估计剩余使用寿命(RUL)。主要思想是将退化过程建模为与时间有关的Ornstein-Uhlenbeck(OU)过程,在该过程中,采用第一次通过失败来考虑相应的RUL估计。时间相关的OU过程通过其在可控制的均值,方差和相关性上的统计特性证明是好的。引入其均值回复特性可从降解记录中的总体降级趋势解释临时相关的波动。基于最大似然估计方法提出了相应的参数估计,然后考虑具有非奇异核的第二类Volterra积分方程,以计算故障时间的概率密度函数(pdf)。案例研究中对提出的方法进行了测试,将结果与非线性漂移,线性扩散过程进行了比较。

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