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Analysis and Design of an RC Snubber Circuit to Suppress False Triggering Oscillation for GaN Devices in Half-Bridge Circuits

机译:用于抑制半桥电路中GaN器件的误触发振荡的RC缓冲电路的分析和设计

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摘要

Wide bandgap devices such as gallium nitride (GaN) devices are being widely used due to their low on-resistance and parasitic parameters that can improve system performance compared to Si mosfets. However, these advantages mentioned above can sometimes lead to unexpected behavior in practical systems, such as false triggering oscillation. False triggering oscillation may cause overshoot, electromagnetic interference, shoot-through, and even device damage, which seriously affects the performance of the system. In this paper, an RC snubber circuit is proposed to suppress false triggering oscillation in a half-bridge circuit, and the design method of the RC parameters is proposed. The proposed oscillation suppression method is simpler, easier to implement, and more effective than the active gate driver. In addition, it can provide guidance for oscillation suppression design in high-order systems. First, the double pulse circuit is used as an example to analyze false triggering oscillation and its high-frequency equivalent circuit is obtained. Then, the RC region is established by scrutinizing the characteristic equations via a root locus method. The RC snubber circuit has better oscillation suppression effect when the RC parameters are within the region rather than outside the region. Finally, the RC region designed by the proposed method is verified by simulation and experiment results, and the proposed method indicates a substantial improvement of the switching characteristics of the controlled device at turn-off.
机译:宽带隙器件(例如氮化镓(GaN)器件)由于其低导通电阻和寄生参数而被广泛使用,与Si MOSFET相比,寄生参数可以改善系统性能。但是,上述这些优点有时会导致在实际系统中发生意外行为,例如错误触发振荡。错误的触发振荡可能会导致过冲,电磁干扰,直通甚至设备损坏,从而严重影响系统的性能。本文提出了一种RC缓冲电路来抑制半桥电路中的虚假触发振荡,并提出了RC参数的设计方法。所提出的振荡抑制方法比有源栅极驱动器更简单,更易于实现并且更有效。另外,它可以为高阶系统的振荡抑制设计提供指导。首先,以双脉冲电路为例,分析误触发振荡,得到其高频等效电路。然后,通过使用根轨迹法检查特征方程来建立RC区域。当RC参数在区域内而不是区域外时,RC缓冲电路具有更好的振荡抑制效果。最后,通过仿真和实验结果验证了该方法设计的RC区域,该方法表明受控设备在关断时的开关特性有了实质性的改善。

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